ISO/TS 17915:2013

Optics and photonics -- Measurement method of semiconductor lasers for sensing

This document has been re-assessed by the committee, and judged to still be up to date.

WARNING: WITHDRAWN Standard. This document has been replaced by

ISO 17915:2018

ISO/TS 17915:2013 describes methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications. ISO/TS 17915:2013 is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields. ISO/TS 17915:2013 is an application of ISO 13695, in which the physical bases are explained.

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Status: WITHDRAWN

Published: 25/06/2013

Pages: 27

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31.260 Optoelectronics. Laser equipment

ISO/TS 17915:2013

Optics and photonics -- Measurement method of semiconductor lasers for sensing

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Optics and photonics -- Measurement method of semiconductor lasers for sensing

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